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analog M3f phase 1: the comparator step in board arithmetic, bit for bit with the model, 15 independent device evaluations per iteration - #11387
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…aluations and one node update in exact integer words -- 613.074 and 613.151 ps, the model's own, 23 to 31 table reads and 141 to 185 multiplications an evaluation (Refs #11380) specs/analog/sar_comparator_qi.t27 (new; nothing existing is edited). The step of sar_comparator_q.t27 is already exact integer arithmetic (u32 words, sign-magnitude u64, 64-bit elimination); the f64 in that file is its judge, so the integer step is that step and the decision times are 613.0742 ps (+2 mV) and 613.1508 ps (-2 mV), 0.0007 and 0.0001 percent from the issue's 613.07 and 613.15, every sample, fold, residual and time those of sq_run, the 2125 step reset run too. FR-001: qi_eval / qi_scatter / qi_assemble / qi_update / qi_iter / qi_step / qi_run, reusing sq_i, sq_fd, sq_qt, sq_slope, sq_qsrc, sq_mul, the stamps and the 8 x 8 solve by `use`. Within 0.5 percent of 613.07 / 613.15 with the sign right at both inputs; negative control: the charge removed decides at 5.40 ps and is refused. FR-002: one Newton iteration is 15 evaluations that read only their own terminals and write one 15-word record each, then one assembly and one node update. Tests: a record is unchanged when a non-terminal node moves and changes when a terminal moves; an evaluation writes nothing but its own slot; five pairs of evaluation/assembly orders give the same 144 registers, the same previous charges and the same nodes after an iteration, bit for bit; whole runs reversed and shuffled fold to the natural fold; leaving out any one of the 15 devices changes the registers. Cost, counted off 876 steps: a full device evaluation is 23 to 31 table reads and 141 to 185 multiplications, a charge-only one 6 to 14 and 39 to 79, a step (75 evaluations) 1518 to 1690 reads and 9517 to 10265 multiplications plus 4 node updates of 224 multiplications and 36 divisions (the loop nest's bound). No speed claim. t27c test-report: 8 tests, FAIL 0, vacuous 0; t27b test --check --quiet exit 0. Phase 2 (the board top) is open. Co-Authored-By: Claude Sonnet 5.5 <noreply@anthropic.com>
…bit with the model, 15 independent device evaluations per iteration (Closes #11386) Merge of master plus sealing, gates run on the merged tree with t27c from master: tests clean with vacuous passes 0, seal --verify MATCH, tri types ratchet CLEAN, dupe_scan failure set a subset of master's. Co-Authored-By: Claude Sonnet 5.5 <noreply@anthropic.com>
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October 20, 2026 13:32
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This was referenced Oct 20, 2026
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Closes #11386
analog M3f phase 1: the comparator step in board arithmetic, bit for bit with the model, 15 independent device evaluations per iteration
Gates run on the merged tree (t27c from master): 1 spec(s) with tests clean and vacuous passes 0, seal --verify MATCH, tri types ratchet CLEAN, dupe_scan failure set a subset of master's (inherited red).
TEST specs/analog/sar_comparator_qi.t27 tests=[8] fail=[0] vacuous=[0]
SEAL specs/analog/sar_comparator_qi.t27 :: all hashes MATCH
TYPES RATCHET: CLEAN
DUPE failing=4 extra-vs-master=[]
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